Taiwan
產品資訊TOP
規格選型
• Downsizing package
• Higher density with stacked layer
• Variety of device combination (SiP)
VT-X700 / VT-X900
High speed automated X-ray CT inspection system For SEMICONDUCTOR
Omron‘s unique Automated inspection capability ensures process quality in a mass-production environment by using Submicron CT imaging with a variety of Metrology data.
更新日期 2015年3月2日
Trends
Technology
Omron’s proven 3D-CT technology leads through
- Fast and Quantitative metrology
- Stable Imaging with Sub-Micron Magnification
- Recipe-based Automated Inspection
Automated Inspection and Metrology in mass production environment
Application
更新日期 2015年3月2日
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